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Titel
Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation / Christoph Huber, Andreas Trügler, Ulrich Hohenester, Yehiam Prior and Wolfgang Kautek
Verfasser/ VerfasserinHohenester, Ulrich ; Huber, Christoph ; Trügler, Andreas ; Prior, Yehiam ; Kautek, Wolfgang In der Gemeinsamen Normdatei der DNB nachschlagen
Erschienen in
Physical Chemistry Chemical Physics, 2014, Jg. 16, H. 6, S. 2181-2728
ErschienenRoyal Society of Chemistry
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SpracheEnglisch
DokumenttypAufsatz in einer Zeitschrift
ISSN1463-9076
URNurn:nbn:at:at-ubg:3-1460 Persistent Identifier (URN)
DOI10.1039/C3CP51730F 
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Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation [2.63 mb]
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A systematic study of the influence of the excitation angle, the light polarization and the coating thickness of commercial SPM tips on the field enhancement in an apertureless scanning near-field optical microscope is presented. A new method to optimize the alignment of the electric field vector along the major tip axis by measuring the resonance frequency was developed. The simulations were performed with a MNPBEM toolbox based on the Boundary Element Method (BEM). The influence of the coating thickness was investigated for the first time. Coatings below 40 nm showed a drastic influence both on the resonance wavelength and the enhancement. A shift to higher angles of incidence for the maximum

enhancement could be observed for greater tip radii.

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CC-BY-Lizenz (4.0)Creative Commons Namensnennung 4.0 International Lizenz